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<oembed><version>1.0</version><provider_name>Arbeitsgemeinschaft der Universit&#xE4;tsverlage</provider_name><provider_url>https://universitaetsverlage.eu</provider_url><author_name>XMLRPC</author_name><author_url>https://universitaetsverlage.eu/author/xmlrpc/</author_url><title>Spectroscopic ellipsometry of interfacial phase transitions in fluid metallic systems: Kx(KCl)1-x and Ga1-xBix - Arbeitsgemeinschaft der Universit&#xE4;tsverlage</title><type>rich</type><width>600</width><height>338</height><html>&lt;blockquote class="wp-embedded-content"&gt;&lt;a href="https://universitaetsverlage.eu/bucher-e-books/titel/spectroscopic-ellipsometry-of-interfacial-phase-transitions-in-fluid-metallic-systems-kxkcl1-x-and-ga1-xbix-ebook/"&gt;Spectroscopic ellipsometry of interfacial phase transitions in fluid metallic systems: Kx(KCl)1-x and Ga1-xBix&lt;/a&gt;&lt;/blockquote&gt;
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&lt;/script&gt;&lt;iframe sandbox="allow-scripts" security="restricted" src="https://universitaetsverlage.eu/bucher-e-books/titel/spectroscopic-ellipsometry-of-interfacial-phase-transitions-in-fluid-metallic-systems-kxkcl1-x-and-ga1-xbix-ebook/embed/" width="600" height="338" title="&#x201E;Spectroscopic ellipsometry of interfacial phase transitions in fluid metallic systems: Kx(KCl)1-x and Ga1-xBix&#x201C; &#x2014; Arbeitsgemeinschaft der Universit&#xE4;tsverlage" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"&gt;&lt;/iframe&gt;</html><thumbnail_url>https://universitaetsverlage.eu/wp-content/uploads/asolmerce/image-9783937300085.jpg</thumbnail_url><thumbnail_width>452</thumbnail_width><thumbnail_height>640</thumbnail_height><description>The investigation of the interfacial phase transitions in fluid systems with short-range intermetallic interactions are of great interest. The phenomena were studied in two systems exhibiting a liquid-liquid miscibility gap: at the fluid/wall interface in fluid KxKCl1-x and at the fluid/vacuum interface of the Ga1 xBix alloys. To characterize the interfacial changes of the ultra thin films (composition, thickness and their evolution with time) the spectroscopic ellipsometry was performed over a wide spectral range. Whereas in the experiments on KxKCl1-x an existing ellipsometer could be used, a completely new UHV-apparatus including the in-situ phase modulation ellipsometer had to be developed for Ga1 xBix alloys. For the KxKCl1-x system new results on complete wetting at solid-liquid coexistence as well as in the homogenous liquid phase (prewetting) are presented. The spectra show the typical F center absorption which indicates that the film is a salt-rich phase. The thickness strongly increases approaching the monotectic from 30 to 440 nm, which is in agreement with the tetra point wetting scenario. For this interpretation a quantitative description of the excess Gibbs energy has been developed. For the Ga1 xBix system the results on complete wetting, surface freezing and oscillatory interfacial instabilities are presented. The high-precision spectra have been recorded approaching the liquid-liquid miscibility. These spectra have been modeled using a Ga-Bi effective medium approximation for the substrate covered by a film of liquid Bi. The measurements give evidence of tetra point wetting in the Ga-Bi system. First ellipsometric study of the surface freezing in Ga-Bi has been performed. Within the miscibility gap a very interesting effect of surface and bulk oscillatory instability was observed. The details of this process at present are not well understood, but a qualitative description is given.</description></oembed>
